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 VLSI Test Principles & Architectures: Design for Testability

 

Published by: MORGAN KAUFMANN
Author: Wang, L et al
Number of pages: 777
Group: CIRCUIT DESIGN
ISBN: 0123705975/9780123705976
User level: Intermediate/Advance
Objective: Reference
Date Published: August 2006
 RRP £36.99 Save 34%
  Our Price £24.41

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  Book Information

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.